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US Patent Issued to ANRITSU on July 14 for "Removed article storage box and article inspection system" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,862, issued on July 14, was assigned to ANRITSU Corp. (Kanagawa, Japan). "Removed article storage box and article inspection system" was in... Read More


US Patent Issued to Pliteq on July 14 for "Acoustic measurement apparatus, kit, and method of use thereof" (Canadian Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,863, issued on July 14, was assigned to Pliteq Inc. (Toronto). "Acoustic measurement apparatus, kit, and method of use thereof" was invente... Read More


US Patent Issued to NEC on July 14 for "Distributed optical fiber sensing (DFOS) system and method of using the same" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,864, issued on July 14, was assigned to NEC Corp. (Tokyo). "Distributed optical fiber sensing (DFOS) system and method of using the same" w... Read More


US Patent Issued to SubCom on July 14 for "Quasi-distributed sensing using enhanced sensing structures" (New Jersey Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,865, issued on July 14, was assigned to SubCom LLC (Eatontown, N.J.). "Quasi-distributed sensing using enhanced sensing structures" was inv... Read More


US Patent Issued to DILAS Diodenlaser on July 14 for "Laser power monitoring with lens sampling device" (German Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,866, issued on July 14, was assigned to DILAS Diodenlaser GmbH (Mainz, Germany). "Laser power monitoring with lens sampling device" was inv... Read More


US Patent Issued to Sony Semiconductor Solutions on July 14 for "Comparator, light detection element, and electronic device" (Japanese Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,868, issued on July 14, was assigned to Sony Semiconductor Solutions Corp. (Kanagawa, Japan). "Comparator, light detection element, and ele... Read More


US Patent Issued to Applied Materials on July 14 for "In-situ reflectometry for real-time selectivity monitoring" (California Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,869, issued on July 14, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "In-situ reflectometry for real-time selectivity moni... Read More


US Patent Issued to California Institute of Technology on July 14 for "Ultra-miniature spatial heterodyne spectrometer" (California Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,870, issued on July 14, was assigned to California Institute of Technology (Pasadena, Calif.). "Ultra-miniature spatial heterodyne spectrom... Read More


US Patent Issued to TONGJI UNIVERSITY, NATIONAL INSTITUTE OF METROLOGY, CHINA on July 14 for "Methods and devices of 425NM wavelength reference construction based on fluorescence-induced effect" (Chinese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,871, issued on July 14, was assigned to TONGJI UNIVERSITY (Shanghai) and NATIONAL INSTITUTE OF METROLOGY, CHINA (Beijing). "Methods and dev... Read More


US Patent Issued to National Tsing Hua University on July 14 for "Two-dimensional hyperspectral imaging system and method thereof" (Washington Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,872, issued on July 14, was assigned to National Tsing Hua University (Hsinchu, Taiwan). "Two-dimensional hyperspectral imaging system and ... Read More